Donggun Lee : rechercher sur Z-Library

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Don't use scam websites

Livres
Articles (148)
Les plus populaires
Liste
- Liste
- Tableau

1

Framework Based on Building Information Modelling for Information Management by Linking Construction Documents to Design Objects; Framework Based on Building Information Modelling for Information Management by Linking Construction Documents to Design Objects;

Cha, HeeSung, Lee, DongGun

Journal:

Journal of Asian Architecture and Building Engineering

Année:

2018

Langue:

english

Fichier:

PDF, 1.19 MB

english, 2018

2

Operation Procedures of a Work-Center-Level Digital Twin for Sustainable and Smart Manufacturing

Park, Kyu Tae, Lee, Donggun, Noh, Sang Do

Journal:

International Journal of Precision Engineering and Manufacturing-Green Technology

Année:

2020

Fichier:

PDF, 6.49 MB

2020

3

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Sub 30 nm multi-bridge-channel MOSFET(MBCFET) with metal gate electrode for ultra high performance application

Eun-Jung Yoon,, Sung-Young Lee,, Sung-Min Kim,, Min-Sang Kim,, Sung Hwan Kim,, Li Ming,, Sungdae Suk,, Kyounghawn Yeo,, Chang Woo Oh,, Jung-dong Choe,, Donguk Choi,, Dong-Won Kim,, Donggun

Année:

2004

Langue:

english

Fichier:

PDF, 237 KB

english, 2004

4

[IEEE Conference Digest [Late News Papers volume included]Device Research Conference, 2004. 62nd DRC. - Notre Dame, IN, USA (June 21-23, 2004)] Conference Digest [Late News Papers volume included]Device Research Conference, 2004. 62nd DRC. - Three-dimensional multi-bridge-channel MOSFET (MBCFET) fabricated on bulk Si-substrate

Sung-Young Lee,, Eun-Jung Yoon,, Sung-Min Kim,, Chang Woo Oh,, Ming Li,, Dong-Won Kim,, Ilsub Chung,, Donggun Park,, Kinam Kim,

Année:

2004

Langue:

english

Fichier:

PDF, 167 KB

english, 2004

5

Predicting psychiatric symptoms by personality types for gifted students

Lee, Seon-Young, An, Donggun, Choe, Seung-Urn

Journal:

High Ability Studies

Année:

2019

Langue:

english

Fichier:

PDF, 1.62 MB

english, 2019

6

[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Evaluation of Ultra Thin Body Si-On-ONO (UTB SOONO) transistors using ultra thin spacer technology

Hyun Jun Bae,, Sung Hwan Kim,, Sung In Hong,, Yong Lack Choi,, Ho Ju Song,, Chang Woo Oh,, Dong-Won Kim,, Park, Donggun, KyungSeok Oh,, Won-Seong Lee,

Année:

2008

Langue:

english

Fichier:

PDF, 386 KB

english, 2008

7

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - A novel sub-50 nm multi-bridge-channel MOSFET (MBCFET) with extremely high performance

Sung-Young Lee,, Eun-Jung Yoon,, Sung-Min Kim,, Chang Woo Oh,, Ming Li,, Jeong-Dong Choi,, Kyoung-Hwan Yeo,, Min-Sang Kim,, Hye-Jin Cho,, Sung-Hwan Kim,, Dong-Won Kim,, Donggun Park,, Kina

Année:

2004

Langue:

english

Fichier:

PDF, 209 KB

english, 2004

8

RF interconnect for multi-gbit/s board-level clock distribution

Woonghwan Ryu,, Junwoo Lee,, Hyungsoo Kim,, Seungyoung Ahn,, Namhoon Kim,, Baekkyu Choi,, Donggun Kam,, Joungho Kim,

Journal:

IEEE Transactions on Advanced Packaging

Année:

2000

Langue:

english

Fichier:

PDF, 651 KB

english, 2000

9

[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Kyoto, Japan (June 14-16, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Sub-25nm single-metal gate CMOS multi-bridge-channel MOSFET (MBCFET) for high performance and low power application

Sung-Young Lee,, Eun-Jung Yoon,, Dong-Suk Shin,, Sung-Min Kim,, Sung-Dae Suk,, Min-Sang Kim,, Dong-Won Kim,, Donggun Park,, Kinam Kim,, Byung-il Ryu,

Année:

2005

Langue:

english

Fichier:

PDF, 932 KB

english, 2005

10

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - Application of actinic mask review system for the preparation of HVM EUV lithography with defect free mask

Sanchez, Martha I., Ukraintsev, Vladimir A., Na, Jihoon, Lee, Donggun, Do, Changhwan, Sim, Hong-seok, Lee, Jung-Hwan, Kim, Jungyoup, Seo, Hwan-Seok, Kim, Heebom, Jeon, Chan Uk

Année:

2017

Langue:

english

Fichier:

PDF, 1.11 MB

english, 2017

11

One-Piece Gravity Compensation Mechanism Using Cam Mechanism and Compression Spring

Lee, Giuk, Lee, Donggun, Oh, Yonghwan

Journal:

International Journal of Precision Engineering and Manufacturing-Green Technology

Année:

2018

Langue:

english

Fichier:

PDF, 1.23 MB

english, 2018

12

Effect of glue on reliability of flip chip BGA packages under thermal cycling

Tung T. Nguyen, Donggun Lee, Jae B. Kwak, Seungbae Park

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2010

13

Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide

Chihoon Lee, Donggun Park, Hyeong Joon Kim, Wonshik Lee

Journal:

Microelectronics Reliability

Année:

2003

Langue:

english

Fichier:

PDF, 313 KB

english, 2003

14

Characteristics of the full CMOS SRAM cell using body-tied TG MOSFETs (bulk FinFETs)

Tai-Su Park, Hye Jin Cho, Jeong Dong Choe, Sang Yeon Han, Donggun Park, Kinam Kim, Yoon, E., Jong-Ho Lee

Journal:

IEEE Transactions on Electron Devices

Année:

2006

Langue:

english

Fichier:

PDF, 707 KB

english, 2006

15

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Degradation of tunnel oxide by FN current stress and its effects on data retention characteristics of 90 nm NAND flash memory cells

Jae-Duk Lee,, Jeong-Hyuk Choi,, Donggun Park,, Kinam Kim,

Année:

2003

Langue:

english

Fichier:

PDF, 305 KB

english, 2003

16

A study on the microstructural and chemical evolution of In–Ga–Zn–O sol–gel films and the effects on the electrical properties

Jeon, Haseok, Song, Jury, Na, Sekwon, Moon, Miran, Lim, Junhyung, Joo, Jinho, Jung, Donggun, Kim, Hyungsub, Noh, Jinsoo, Lee, Hoo-Jeong

Journal:

Thin Solid Films

Année:

2013

Langue:

english

Fichier:

PDF, 1.14 MB

english, 2013

17

Characteristics of aluminum-doped zinc oxide films with oxygen plasma treatment for solar cell applications

Park, Yong Seob, Seo, Munsoo, Yi, Junsin, Lim, Donggun, Lee, Jaehyeong

Journal:

Thin Solid Films

Année:

2013

Langue:

english

Fichier:

PDF, 771 KB

english, 2013

18

Improvement of the characteristics of chemical bath deposition-cadmium sulfide films deposited on an O2 plasma-treated polyethylene terephthalate substrate

Lim, Donggun, Lee, Jaehyeong, Song, Woochang

Journal:

Thin Solid Films

Année:

2013

Langue:

english

Fichier:

PDF, 716 KB

english, 2013

19

Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs

Jin-Woo Han,, Choong-Ho Lee,, Donggun Park,, Yang-Kyu Choi,

Journal:

IEEE Electron Device Letters

Année:

2006

Langue:

english

Fichier:

PDF, 122 KB

english, 2006

20

[IEEE 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - Austin, TX, USA (2005.05.11-2005.05.11)] 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - The application of BT-FinFET technology for sub 60nm DRAM integration

Choong-Ho Lee,, Jac-Man Yoon,, Chul Lee,, Keunnam Kim,, Seung Bae Park,, Young Joon Ann,, Hee Soo Kang,, Donggun Park,

Année:

2005

Langue:

english

Fichier:

PDF, 582 KB

english, 2005

21

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Hot carrier generation and reliability of BT(body-tied)-fin type SRAM cell transistors (W/sub fin/=20~70nm)

Young Jomi Ahn,, Hye Jin Cho,, Hee Soo Kang,, Choong-Ho Lee,, Choi Lee,, Jac-man Yoon,, Tac Yong Kim,, Eno Suk Cho,, Suk-Kang Sung,, Donggun Park,, Kinam Kim,, Byung-Il Ryu,

Année:

2005

Langue:

english

Fichier:

PDF, 574 KB

english, 2005

22

[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Temperature dependent transport characteristics of multi-bridge-channel MOSFETs (MBCFETs)

YoungChai Jung,, KeunHwi Cho,, ByoungHak Hong,, SuHeon Hong,, SungWoo Hwang,, Ahn, D., Sung-Young Lee,, Min-Sang Kim,, Eun-Jung Yoon,, Dong-Won Kim,, Donggun Park,

Année:

2007

Langue:

english

Fichier:

PDF, 335 KB

english, 2007

23

Pilot Signal Design for Massive MIMO Systems: A Received Signal-To-Noise-Ratio-Based Approach

So, Jungho, Kim, Donggun, Lee, Yuni, Sung, Youngchul

Journal:

IEEE Signal Processing Letters

Année:

2015

Langue:

english

Fichier:

PDF, 1.22 MB

english, 2015

24

[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Sub-20nm Surrounding-Gate Bridge-Channel MOSFETs for Low Power and High Performance Applications

Yun, Eun Jung, Lee, Sung-Young, Kim, Min Sang, Kim, Sung Min, Choi, Inhyuk, Lee, Jimyoung, Park, Bork Kyoung, Kim, Dong-Won, Park, Donggun

Année:

2007

Langue:

english

Fichier:

PDF, 2.34 MB

english, 2007

25

[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Characteristics of MBCFET (Multi-Bridge-Channel MOSFET) with Tall-Embedded-Gate (TEG)

Yun, Eun, Kim, Min, Kim, Sung, Lee, Sung-young, Kim, Dong-won, Park, Donggun

Année:

2006

Langue:

english

Fichier:

PDF, 371 KB

english, 2006

26

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Effects of RTA and WSi/sub x/-polycide gate processes on MOSFET reliability for giga-bit scale DRAMs

Donggun Park,, Nak-Jin Son,, Ji-Young Kim,, Wonshik Lee,

Année:

2000

Langue:

english

Fichier:

PDF, 319 KB

english, 2000

27

Chalcopyrite thin films and solar cells prepared by using selenoamide as a selenium source

Erkan, Mehmet Eray, Wu, Shenbin D., Lee, Chun-Young, Kim, Min-Young, Lim, Donggun, Kim, Kyungkon, Jin, Michael H.-C.

Journal:

Thin Solid Films

Année:

2015

Langue:

english

Fichier:

PDF, 1.89 MB

english, 2015

28

Overdrive technology compensating for ambient temperature

Kim, Minkoo, Kim, Jong-Man, Lee, Donggun, Lee, Seung-Woo

Journal:

Optical Engineering

Année:

2015

Langue:

english

Fichier:

PDF, 3.73 MB

english, 2015

29

[IEEE 2016 First IEEE International Conference on Computer Communication and the Internet (ICCCI) - Wuhan, China (2016.10.13-2016.10.15)] 2016 First IEEE International Conference on Computer Communication and the Internet (ICCCI) - New automatic de-registration method utilizing a timer in the IEEE802.1 TSN

Park, Donggun, Lee, Juho, Park, Culsun, Park, Sungkwon

Année:

2016

Langue:

english

Fichier:

PDF, 407 KB

english, 2016

30

Determining Value at Risk for Estimating Renovation Building Projects by Application of Probability-based Fuzzy Set Theory

Cha, HeeSung, Lee, DongGun

Journal:

Journal of Asian Architecture and Building Engineering

Année:

2018

Langue:

english

Fichier:

PDF, 626 KB

english, 2018

31

A Hopf-Lax Formula in HamiltonâJacobi Analysis of Reach-Avoid Problems

Lee, Donggun, Tomlin, Claire J.

Journal:

IEEE Control Systems Letters

Année:

2021

Fichier:

PDF, 645 KB

2021

32

Influence of different plasma treatments on electrical and optical properties on sputtered AZO and ITO films

Jaehyung Lee, Donggun Lim, Keajoon Yang, Wonseok Choi

Journal:

Journal of Crystal Growth

Année:

2011

Langue:

english

Fichier:

PDF, 1.96 MB

english, 2011

33

Scalable 2-bit silicon–oxide–nitride–oxide–silicon (SONOS) memory with physically separated local nitrides under a merged gate

Yong Kyu Lee, Suk Kang Sung, Jae Sung Sim, Ki Whan Song, Jong Duk Lee, Byung-Gook Park, Sung Taeg Kang, Chilhee Chung, Donggun Park, Kinam Kim

Journal:

Solid-State Electronics

Année:

2004

Langue:

english

Fichier:

PDF, 485 KB

english, 2004

34

NEMS switch with 30 nm-thick beam and 20 nm-thick air-gap for high density non-volatile memory applications

Weon Wi Jang, Jun-Bo Yoon, Min-Sang Kim, Ji-Myoung Lee, Sung-Min Kim, Eun-Jung Yoon, Keun Hwi Cho, Sung-Young Lee, In-Hyuk Choi, Dong-Won Kim, Donggun Park

Journal:

Solid-State Electronics

Année:

2008

Langue:

english

Fichier:

PDF, 506 KB

english, 2008

35

Growth and characterization of indium tin oxide thin films deposited on PET substrates

Jaehyeong Lee, Hakkee Jung, Jongin Lee, Donggun Lim, Keajoon Yang, Junsin Yi, Woo-Chang Song

Journal:

Thin Solid Films

Année:

2008

Langue:

english

Fichier:

PDF, 290 KB

english, 2008

36

25-nm programmable virtual source/drain MOSFETs using a twin SONOS memory structure

Woo Young Choi, Byung Yong Choi, Dong-Won Kim, Choong-Ho Lee, Donggun Park, Jong Duk Lee, Byung-Gook Park

Journal:

Solid-State Electronics

Année:

2006

Langue:

english

Fichier:

PDF, 438 KB

english, 2006

37

2,3,7,8-TCDD neurotoxicity in neuroblastoma cells is caused by increased oxidative stress, intracellular calcium levels, and tau phosphorylation

Donggun Sul, Hyo-Shin Kim, Eun-Kyung Cho, Min Lee, Hyun Sook Kim, Woon-Won Jung, Kwang Woo Hwang, So-Young Park

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 546 KB

english, 2009

38

Effects of bias voltage on the properties of ITO films prepared on polymer substrates

Jaehyeong Lee, Hakkee Jung, Donggun Lim, Keajoon Yang, Woochang Song, Junsin Yi

Journal:

Thin Solid Films

Année:

2005

Langue:

english

Fichier:

PDF, 290 KB

english, 2005

39

Structural, electrical and optical properties of ZnO:Al films deposited on flexible organic substrates for solar cell applications

Jaehyeong Lee, Dongjin Lee, Donggun Lim, Keajoon Yang

Journal:

Thin Solid Films

Année:

2007

Langue:

english

Fichier:

PDF, 682 KB

english, 2007

40

Quasi 3-D Velocity Saturation Model for Multiple-Gate MOSFETs

Jin-Woo Han, Choong-Ho Lee, Donggun Park, Yang-Kyu Choi

Journal:

IEEE Transactions on Electron Devices

Année:

2007

Langue:

english

Fichier:

PDF, 355 KB

english, 2007

41

SPIE Proceedings [SPIE Smart Structures and Materials - San Diego, CA (Sunday 2 March 2003)] Smart Structures and Materials 2003: Industrial and Commercial Applications of Smart Structures Technologies - Thin-layer magnetostrictive composite films for turbomachinery fan blade damping

Pulliam, Wade J., Lee, Donggun, Carman, Gregory P., McKnight, Geoffrey P., Anderson, Eric H.

Année:

2003

Langue:

english

Fichier:

PDF, 805 KB

english, 2003

42

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Novel body tied FinFET cell array transistor DRAM with negative word line operation for sub 60nm technology and beyond

Lee, C.H., Yoon, J.M., Lee, C., Yang, H.M., Kim, K.N., Kim, T.Y., Kang, H.S., Ahn, Y.J., Donggun Park,, Kinam Kim,

Année:

2004

Langue:

english

Fichier:

PDF, 196 KB

english, 2004

43

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Test structure for performance evaluation of 3 dimensional FinFETs

Young Joon Ahn,, Hye Jin Cho,, Hee Soo Kang,, Choong-Ho Lee,, Chul Lee,, Jae-man Yoon,, Tae Yong Kim,, Eun Suk Cho,, Suk-kang Sung,, Donggun Park,, Kinam Kim,, Byung-Il Ryu,

Année:

2005

Langue:

english

Fichier:

PDF, 540 KB

english, 2005

44

[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - Floating Body DRAM Characteristics of Silicon-On-ONO (SOONO) Devices for System-on-Chip (SoC) Applications

Oh, Chang Woo, Kim, Na Young, Song, Ho Ju, Hong, Sung In, Kim, Sung Hwan, Choi, Yong Lack, Bae, Hyun Jun, Choi, Dong Uk, Lee, Yong Seok, Kim, Dong-Won, Park, Donggun, Ryu, Byung-Il

Année:

2007

Langue:

english

Fichier:

PDF, 4.12 MB

english, 2007

45

[IEEE 2006 IEEE international SOI - Niagara Falls, NY, USA (2006.10.2-2006.10.5)] 2006 IEEE international SOI Conferencee Proceedings - Performance Enhancement for Ultra Thin Body MOSFETs Using Ultra Thin Spacer

Kim, Sung, Oh, Chang, Hong, Sung, Choi, Yong, Kim, Na, Bae, Hyun, Lee, Ji-hyun, Lee, Kong, Yoon, Je, Kim, Dong-won, Park, Donggun

Année:

2006

Langue:

english

Fichier:

PDF, 2.11 MB

english, 2006

46

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Retention Reliability of FinFET SONOS Device

Lee, Jong, Lee, Se, Chae, Heesoon, Choi, Byung, Sung, Suk-kang, Kim, Seok, Cho, Eun, Lee, Choong, Park, Donggun

Année:

2006

Langue:

english

Fichier:

PDF, 558 KB

english, 2006

47

Fully integrated SONOS flash memory cell array with BT (body tied)-FinFET structure

Suk-Kang Sung,, Tae-Yong Kim,, Eun Suk Cho,, Hye Jin Cho,, Byung Yong Choi,, Chang Woo Oh,, Byung-Kyu Cho,, Choong-Ho Lee,, Donggun Park,

Journal:

IEEE Transactions on Nanotechnology

Année:

2006

Langue:

english

Fichier:

PDF, 1.18 MB

english, 2006

48

Ir(III)-Catalyzed Mild C–H Amidation of Arenes and Alkenes: An Efficient Usage of Acyl Azides as the Nitrogen Source

Ryu, Jaeyune, Kwak, Jaesung, Shin, Kwangmin, Lee, Donggun, Chang, Sukbok

Journal:

Journal of the American Chemical Society

Année:

2013

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2013

49

[IEEE 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) - Honolulu, HI, USA (2010.06.20-2010.06.25)] 2010 35th IEEE Photovoltaic Specialists Conference - Comparative study of CdTe thin film solar cells with wet and dry CdCl2 treatment process

Lee, Jaehyung, Ryu, Hyunmin, Lim, Donggun, Yang, Keajoon, Choi, Wonseok, Yi, Junsin

Année:

2010

Langue:

english

Fichier:

PDF, 781 KB

english, 2010

50

Iridium-Catalyzed Direct Arene C–H Bond Amidation with Sulfonyl- and Aryl Azides

Lee, Donggun, Kim, Youngchan, Chang, Sukbok

Journal:

Journal of Organic Chemistry

Année:

2013

Langue:

english

Fichier:

PDF, 514 KB

english, 2013